VizieR

CfA VizieR . ADAC VizieR . Cambridge (UK) VizieR . IUCAA VizieR . INASAN VizieR .

VizieR

Simple TargetList Of TargetsFast Xmatch with large catalogs or Simbad
Target Name (resolved by Sesame) or Position:
 Target dimension:
NB: The epoch used for the query is the original epoch of the table(s)Radius Box size

  
J/ApJS/179/124
  Subaru/XMM-Newton deep survey (SXDS) III. (Ueda+, 2008)
ReadMe+ftp
2008ApJS..179..124U
Similar Catalogs
Post annotation 		img(gal)
1.J/ApJS/179/124/table2The X-ray source list of the SXDS (1245 rows)

Simple ConstraintList Of Constraints
 
Query by Constraints constraints help applied on Columns (Output Order: + - )
ShowSortColumn  Constraint Explain   (UCD)
  recno  Record number assigned by the VizieR team. Should Not be used for identification. (meta.record)
  [UWS2008]  XMM source number in SXDS field (Note 1)   (meta.id;obs.field)
  RAJ2000 deg (i) XMM Right Ascension (J2000) (pos.eq.ra;meta.main)
  DEJ2000 deg (i) XMM Declination (J2000) (pos.eq.dec;meta.main)
  e_pos arcsec Statistical positional error (Note 2)   (stat.error)
  L(US)  Ultra-soft (0.3-0.5keV) band maximum likelihood (stat.likelihood)
  L(S)  Soft (0.5-2keV) band maximum likelihood (stat.likelihood)
  L(M)  Medium (2-4.5keV) band maximum likelihood (stat.likelihood;instr.bandpass)
  L(UH)  Ultra-hard (4.5-10keV) band maximum likelihood (stat.likelihood)
  L(XID)  XID (0.5-4.5keV) band maximum likelihood (stat.likelihood)
  L(H)  Hard (2-10keV) band maximum likelihood (stat.likelihood)

ALL cols		    
 (i)indexed column
  CR(US) ct/ks Ultra-soft (0.3-0.5keV) band count rate (Note 3)   (phot.count;em.X-ray)
  e_CR(US) ct/ks The 1σ uncertainty in CR(US) (stat.error)
  CR(S) ct/ks Soft (0.5-2keV) band count rate (Note 3)   (phot.count;em.X-ray)
  e_CR(S) ct/ks The 1σ uncertainty in CR(S) (stat.error)
  CR(M) ct/ks Medium (2-4.5keV) band count rate (Note 3)   (phot.count;em.X-ray)
  e_CR(M) ct/ks The 1σ uncertainty in CR(M) (stat.error)
  CR(UH) ct/ks Ultra-hard (4.5-10keV) band count rate (Note 3)   (phot.count;em.X-ray)
  e_CR(UH) ct/ks The 1σ uncertainty in CR(UH) (stat.error)
  HR1  (n) Hardness ratio 1 (Note 4)   (phot.flux;arith.ratio)
  e_HR1  (n) The 1σ uncertainty in HR1 (stat.error)
  HR2  (n) Hardness ratio 2 (Note 4)   (phot.flux;arith.ratio)
  e_HR2  (n) The 1σ uncertainty in HR2 (stat.error)
  HR3  (n) Hardness ratio 3 (Note 4)   (phot.flux;arith.ratio)
  e_HR3  (n) The 1σ uncertainty in HR3 (stat.error)
  Fld   [1-7] Pointing ID where source detected (SDS) (meta.id;meta.main)
  Off arcmin Offset angle (Note 5)   (instr.offset)
  Exp ks Total pn-equivalent exposure (Note 6)   (time.duration;obs.exposure)
  bg ct/Ms/arcsec2Background rate in 0.5-4.5keV band at source (arith.rate;instr.background;em.X-ray.medium)
  Note (char) [C] Multiple source (Note 7)   (meta.note)

ALL cols		    
(n) indicates a possible blank or NULL column(i)indexed column
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